Low-power Design for Testability (DFT) is essential for modern SoCs where power consumption during testing can significantly exceed functional power limits. As designs shrink and complexity grows, managing both static and dynamic power during scan shift and capture cycles becomes critical to prevent thermal damage and IR drop-related failures. Avecas provides specialized DFT for Low Power services, implementing advanced power-aware strategies that ensure high fault coverage without compromising silicon integrity or battery life.
Our services ensure that your power-sensitive designs are testable, reliable, and production-ready.
We design and implement scan architectures that minimize switching activity. By utilizing techniques like scan chain partitioning and reordering, we reduce the total toggle rate during the shift phase. This prevents excessive heat dissipation and protects the chip from thermal stress during long test sequences. Optimized architectures reduce the risk of thermal-induced yield loss.
Avecas utilizes advanced ATPG techniques to generate test patterns with controlled switching activity. We implement fill-bits and X-filling strategies to minimize transitions during shift, and use staggered clocking to manage peak capture power. This ensures the chip remains within its power budget during the entire test process. Smart pattern generation prevents IR drop and false test failures.
We provide comprehensive testing for designs with multiple power islands and voltage domains. Our engineers ensure that isolation cells, level shifters, and retention registers are fully verified according to IEEE 1801 (UPF/CPF) standards. We validate that power management logic operates correctly under all test conditions. UPF-compliant DFT ensures seamless power domain verification.
Our team integrates and verifies Integrated Clock Gating (ICG) cells specifically for test modes. We ensure that inactive logic is effectively gated during test to save power, and we validate the interaction between the DFT logic and the on-chip Power Management Unit (PMU). Efficient clock management significantly lowers dynamic test power.
We perform gate-level power analysis to identify potential IR drop “hotspots” during the test phase. By simulating scan patterns with layout-extracted data, we ensure that peak power consumption does not lead to voltage droop, which could cause functional errors during silicon validation. In-depth analysis ensures patterns are safe for high-volume manufacturing.
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Ensures the design remains within its functional power envelope.
Your Partner for Power-Efficient Testing
We support Low Power DFT activities using industry-standard tools and proven methodologies to ensure power integrity and high test quality.
Advanced pattern generation and compression techniques designed to limit switching activity and manage power during test cycles.
Seamless integration of DFT structures within multi-voltage designs using Unified Power Format (UPF) and Common Power Format (CPF) standards.
Detailed analysis based on VCD/FSDB files to evaluate power consumption and ensure it stays within the functional power envelope.
Rigorous gate-level verification to validate IR drop and prevent thermal-induced failures during high-speed scan operations.
designing advanced SoCs.
with specialized process needs.
demanding low-power solutions.
requiring safety-critical libraries.
