ATE program development turns a device specification into a production-ready test solution. Avecas delivers the test program, the interface hardware, and the test-flow logic needed to test economically and reliably at high volume, with correlation evidence that the program measures what the datasheet demands.

Multi-Platform Expertise

We develop on Teradyne UltraFLEX (IG-XL) and J750, and Advantest V93000 (SmarTest 8, Wave Scale and Pin Scale), covering SoC, memory, RF/mmWave, and mixed-signal devices. Content spans DC parametric, scan and functional patterns, mixed-signal, and RF measurement, with timing and level set-up correlated back to bench and characterisation data.

Hardware & Flow Engineering

We design and qualify Device Interface Boards and probe cards, handling schematic capture, PCB stack-up and layout, SI/PI analysis, power delivery and decoupling, thermal management, and socket qualification per NPI. Test flows use adaptive test, smart-bin wafer maps, SPC, and multi-site parallelism to cut tester time while protecting quality.

Bring-Up & Production Handover

We bring up the test cell, run site-to-site correlation and gage R&R, debug first-silicon test escapes, document the program, and hand over a stable, production-qualified solution to your manufacturing or OSAT partner.

• Test program development across DC, scan, functional, MS, and RF
• DIB and probe-card design, layout, and qualification
• Test-cell bring-up, gage R&R, and site-to-site correlation
• Documented, production-qualified handover

The result is a fully characterised program ready to run at scale from day one.

We also maintain program version control, characterisation-to-production correlation records, and clear release notes, so the test program stays maintainable across device steppings, ATE relocations, and capacity expansions.