At Avecas, our Post-Silicon Validation services bridge RTL simulation and volume production—validating that fabricated silicon matches design intent across all functional modes, performance corners, and protocol compliance requirements.
Comprehensive Protocol Compliance
PCIe Gen4/5, USB 3.x/4, DDR4/5, LPDDR4/5, CXL 2.0/3.0, Ethernet 1G–8.00G, MIPI, and HDMI/DisplayPort with certified test suites.
Power Validation Depth
Per-domain active and leakage current, DVFS characterisation, sleep/wake latency, and thermal power—compared against pre-silicon estimates.
RTL-to-Silicon Correlation
We root-cause discrepancies using JTAG, embedded trace (ETM/ITM), logic analysers, and protocol analysers.
Feel free to email us on below email address, we will be happy to answer your queries.
Discrepancies root-caused via JTAG and embedded trace, then fed back to design for ECO or next-revision fixes.
Our post-silicon capabilities span functional coverage, protocol compliance, performance characterisation, power validation, and debug correlation—all under one expert team.
Directed and pseudo-random functional test execution with coverage tracking against simulation regression and silicon-specific test development.
Interface compliance for PCIe, USB, DDR, CXL, Ethernet, MIPI, and DisplayPort using certified test suites from Keysight, Tektronix, and Spirent.
CPU/GPU IPC measurement, memory bandwidth, SerDes BER sweeping, and power/performance characterisation across voltage and frequency corners.
Active and leakage current per power domain, DVFS validation, sleep/wake latency profiling, and thermal power vs pre-silicon budget.





Post-silicon validation bridges pre-silicon simulation and volume production, confirming that fabricated silicon matches design intent across every functional mode, performance corner, and protocol-compliance requirement. It is where real hardware behaviour is measured, characterised, debugged, and signed off for production.
We execute directed and pseudo-random functional tests with coverage tracking against simulation goals, and run interface compliance for PCIe Gen4/5, USB 3.x/4, DDR4/5 and LPDDR4/5, CXL 2.0/3.0, Ethernet (1G to 800G), MIPI, and HDMI/DisplayPort using certified suites and protocol analysers from Keysight, Tektronix, and Spirent, including eye-diagram and link-training verification.
Characterisation covers CPU/GPU IPC, memory bandwidth and latency, SerDes bit-error-rate sweeps, and power/performance shmoo across voltage, frequency, and temperature. Power validation measures active and leakage current per domain, DVFS operating points, sleep/wake latency, and thermal power against pre-silicon estimates.
Discrepancies are root-caused using JTAG, embedded trace (ETM/ITM), logic analysers, and protocol analysers, then fed back to design for ECO or next-revision fixes, closing the loop between intent and silicon.
You receive validated, characterised silicon and a clear record of every issue found and resolved.
We also provide bring-up-to-validation continuity, reusing the debug infrastructure and golden configurations established during silicon bring-up, and deliver a validation report mapping each tested feature and corner to its pass/fail evidence for production sign-off.
Post-silicon validation questions arise at every first silicon milestone. Here are answers to the most common questions our customers ask when planning their validation strategy.
Post-silicon validation confirms that fabricated silicon matches design intent across all functional modes, performance corners, and protocol-compliance requirements. It bridges pre-silicon simulation and volume production, finding bugs that only appear on real hardware.
We validate PCIe Gen4/5, USB 3.x/4, DDR4/5 and LPDDR4/5, CXL 2.0/3.0, Ethernet, MIPI, and HDMI/DisplayPort using certified compliance suites and protocol analysers from Keysight, Tektronix, and others.
We measure CPU/GPU IPC, memory bandwidth, SerDes bit-error-rate (BER) sweeps, and full power/performance characterisation across voltage, frequency, and temperature corners.
We measure active and leakage current per power domain, validate DVFS operating points, profile sleep/wake latency, and compare measured power against pre-silicon estimates to confirm power-management correctness.
We root-cause discrepancies using JTAG, embedded trace (ETM/ITM), logic analysers, and protocol analysers, then feed findings to design and DV teams for ECO or next-revision fixes.