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At Avecas, our Test Program Development (TPD) services translate device specifications into executable ATE test programs—covering digital, mixed-signal, RF, and power management devices across Teradyne, Advantest, and Cohu platforms.
Full-Spectrum Test Coverage
From DC parametric and ATPG functional patterns through ADC/DAC linearity, RF power/EVM, and PMIC regulation—one team handles every test category.
Pattern Porting & Verification
STIL/WGL to IG-XL or SmarTest conversion with timing calibration, strobe alignment, and coverage parity vs simulation.
RF & Mixed-Signal Expertise
Wi-Fi 6/7, 5G NR, Bluetooth, and mmWave RF test alongside ADC/DAC INL/DNL, SNR, PSRR, and bandwidth tests.
Feel free to email us on below email address, we will be happy to answer your queries.
STIL/WGL to IG-XL or SmarTest with timing calibration, strobe alignment, and coverage-parity verification.
Our TPD capabilities span test plan authoring, digital pattern porting, mixed-signal test, RF/mmWave test, and power management test—for any device type on any major ATE platform.
Test Program Development (TPD) translates a device datasheet and DFT architecture into an executable ATE program where every specified parameter is measured with correct limits, timing, and coverage. The result is a defensible, traceable test that protects quality at volume and stands up to customer and audit scrutiny.
We author test plans and DC parametric tests, mixed-signal content (ADC/DAC INL/DNL, THD+N, SNR, SFDR, PSRR, CMRR, and bandwidth), RF tests (output power, gain, EVM, noise figure, S-parameters, and spectral mask), and power-management tests (LDO regulation accuracy, switching-converter efficiency, load and line transient, and soft-start) across Teradyne, Advantest, and Cohu platforms.
A traceability matrix maps every datasheet parameter to a specific guard-banded test. Existing patterns are ported (STIL/WGL to IG-XL or SmarTest) with timing calibration, strobe alignment, and coverage-parity verification against simulation and bench characterisation, so behaviour matches intent on the new platform.
Every program ships with guard-band rationale, correlation data, and documentation your quality and production teams need to release with confidence and maintain over the product life.
You get complete, audit-ready test coverage mapped directly to the device specification.
We also build in measurement repeatability and reproducibility (gage R&R) studies, guard-band optimisation that balances yield against quality risk, and clear limit-setting documentation that survives audits and customer quality reviews.
Test program development questions arise when kicking off NPI or reviewing test coverage gaps. Here are answers to the most frequently asked questions.